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| Stephen G. Urquhart |
Associate Professor of Chemistry Associate
Member, Department of
Physics |
Physical and materials
chemistry, Synchrotron chemistry |
| B.Sc.(Hons.) McMaster
University, 1992 |
| Ph.D. McMaster University,
1997 |
| Office: |
Thorvaldson 157 |
| Phone: |
(306) 966-4657 |
| Fax: |
(306) 966-4730 |
| email: |
stephen.urquhart@usask.ca |
| Group Web
site |
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Graduate Student Positions Available - Chemistry and Physics
PhD Position Available - X-ray Microscopy of Strain in Semiconductor Materials
Research Interests:
We use the tools of x-ray absorption spectroscopy and x-ray
microscopy to study the structure and properties of materials. Scanning
Transmission X-ray Microscopy (STXM) and PhotoElectron Emission Microscopy
(PEEM) are forms of chemical imaging that combine the chemical sensitivity of
Near Edge X-ray Absorption Fine Structure (NEXAFS) spectroscopy with high
spatial resolution x-ray microscopy (35-50 nm spatial resolution for STXM).
X-ray spectromicroscopy is developing as a valuable complement to traditional
electron and scanned probe microscopy for materials research. My research is
focused in two areas:
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Materials Chemistry We use X-ray microscopy to study
the structure and composition of complex, nanostructured materials, with an eye
to understanding the thermodynamics and kinetics of nanostructure
formation. Organic nanostructures are of particular interest, where we use epitaxy to
control and pattern molecular orientation at microscopic length scales. We
also study the embrittlement mechanisms in stainless steel alloys (in
collaboration with Syncrude) and phase separated Langmuir Blodgett thin films
(in collaboration with M. Paige, Chemistry)
- Molecular Spectroscopy
The chemical sensitivity of Near Edge
X-ray Absorption Fine Structure (NEXAFS) spectroscopy provides the exquisite
sensitivity of x-ray microscopy for basic and applied materials chemistry
analysis, particularly as it can provide detailed and quantitative
chemical information at high spatial resolution (e.g. below 50 nm). My
research combines experimental and computational studies to understand the
structure - spectral relationships for organic molecules. These questions
range from the practical to the esoteric, such as the nature of "matrix
effects" in condensed molecules, orientation dependence in complex organic
molecules, and the natural circular dichroism of chiral organic molecules at
x-ray wavelengths.
Third generation synchrotron sources such as the Canadian Light Source offer new opportunities for materials analysis and for
fundamental spectroscopy. I am closely involved in the development of new
spectromicroscopy at the Canadian Light Source, consisting of an Elliptically
Polarized Undulator (EPU) source, and two state-of- the-art x-ray microscopes, a
Photoelectron emission microscope (PEEM) and a Scanning Transmission X-ray
Microscope (STXM).
Representative Publications:
- S. Christensen, U.D. Lanke, B. Haines, S.G. Urquhart, S.E. Qaqish, M.F.
Paige, S.G. Urquhart, Structural and compositional mapping of a phase-separated Langmuir-Blodgett
monolayer by X-ray photoelectron emission microscopy, 2008 Journal
of Electron Spectroscopy and Related Phenomena 162(3) 107-114.
- S.G. Urquhart, U.D. Lanke, J. Fu, 2008, Characterisation
of molecular orientation in organic nanornaterials by X-ray Linear Dichroism
Microscopy, International Journal of Nanotechnology, 5(9-12)
1138-1170.
- E. Otero, R.G. Wilkes, T. Regier, R.I.R. Blyth, A. Moewes, S.G. Urquhart,
2008 Substituent effects in the iron 2p and carbon 1s edge near-edge
X-ray absorption fine structure (NEXAFS) spectroscopy of ferrocene compounds,
Journal of Physical Chemistry A 112(4) 624-634.
- J. Fu, S.G. Urquhart, 2007, Effect of chain length and substrate
temperature on the growth and morphology of n-alkane thin films,
Langmuir, 23, 2615-2622.
- E. Otero, S.G. Urquhart, 2006, Nitrogen 1s near-edge X-ray
absorption fine structure spectroscopy of amino acids: Resolving zwitterionic
effects, Journal of Physical Chemistry A, 110, 12121-12128.
- J. Fu, S.G. Urquhart, 2005, Linear dichroism the X-ray
absorption spectra of linear n-alkanes, Journal of Physical Chemistry
A, 109, 11724-11732.
- S. G. Urquhart, R. Gillies, 2005, Rydberg-Valence Mixing in the
Carbon 1s Near-Edge X-ray Absorption Fine Structure Spectra of Gaseous
Alkanes. 2005. Journal of Physical Chemistry A 109, 2151-2159.
- R.R. Cooney, S.G Urquhart, 2003, Chemical Trends in the Near-Edge
X-ray Absorption Fine Structure of Monosubstituted and Para-Bisubstituted
Benzenes,Journal of Physical Chemistry B, 108,
18185-18191.
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